TEST AND MEASUREMENT DEVICE AND METHOD OF OPERATING TEST AND MEASUREMENT DEVICE

Title:

TEST AND MEASUREMENT DEVICE AND METHOD OF OPERATING TEST AND MEASUREMENT DEVICE

Document Type and Number:

Japanese Patent JP2023100598

Kind Code:

A

Abstract:

To decrease the amount of kick-out energy from a sampling circuit.SOLUTION: A test and measurement device includes an input port 102 to receive an input signal. A sampling circuit 110 is structured to generate a sample from the input signal, and generating the sample from the input signal produces a certain amount of kick-out energy. A pick-off/termination circuit 120 is coupled between the sampling circuit 110 and one or more other components of the test and measurement device as an energy reducing circuit structured to decrease the amount of kick-out energy from the sampling circuit 110.SELECTED DRAWING: Figure 1A

Inventors:

PAVEL R GIVNEY

Application Number:

JP2023000468A

Publication Date:

July 19, 2023

Filing Date:

January 05, 2023

Export Citation:

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Assignee:

TEKTRONIX INC

International Classes:

G01R13/34

Attorney, Agent or Firm:

Hiroshi Arafune
Yoshio Arafune

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