Title:
試験測定機器及び波形表示方法
Document Type and Number:
Japanese Patent JP5817041
Kind Code:
B2
Abstract:
A test and measurement instrument and method for providing post-acquisition trigger control and presentation of associated waveforms on a display (135). An electrical signal under test is sampled and digitized, and stored in an acquisition memory (115) as a data record. A display device draws a waveform associated with the signal under test. After the acquisition of the digital samples is stopped, a user selects trigger criteria using trigger controls such as a trigger level control. A trigger circuit (125) detects a post-acquisition trigger event in the data record based on the trigger criteria causing an automatic adjustment of the waveform to conform to a time of the post-acquisition trigger event. One or more configurable trigger controls can be used to adjust a display of post-acquisition trigger events and waveforms. Upon resumption of the live-acquisition of data, the live waveform conforms to the newly selected trigger criteria as previewed during the post-acquisition mode.
Inventors:
Josha A. Berthelet
Christy El Beis
Stephen Kay Sullivan
Christy El Beis
Stephen Kay Sullivan
Application Number:
JP2010189972A
Publication Date:
November 18, 2015
Filing Date:
August 26, 2010
Export Citation:
Assignee:
TEKTRONIX,INC.
International Classes:
G01R13/20
Domestic Patent References:
| JP2003344454A | ||||
| JP63186152A | ||||
| JP4320970A | ||||
| JP6069854U | ||||
| JP2007333391A | ||||
| JP2000028644A | ||||
| JP57204475A | ||||
| JP7035781A | ||||
| JP9318669A |
Foreign References:
| US4837561 | ||||
| US5375067 |
Attorney, Agent or Firm:
Yamaguchi International Patent Office