Title:
TEST AND MEASUREMENT SYSTEM AND METHOD OF TESTING DEVICE UNDER TEST
Document Type and Number:
Japanese Patent JP2023026402
Kind Code:
A
Abstract:
To allow for quickly performing TDECQ measurement and determining parameters of DUT.SOLUTION: A test and measurement system comprises a test and measurement instrument 10 and a test automation platform 30, and is configured to receive a waveform generated by operation of a device under test 14, generate first and second tensor arrays, apply machine learning to the first tensor array to produce equalizer tap values, apply machine learning to the second tensor array to produce predicted tuning parameters for the device under test, use the equalizer tap values to produce a TDECQ value, and provide the TDECQ value and the predicted tuning parameters to the test automation platform 30.SELECTED DRAWING: Figure 1
Inventors:
PICKERD JOHN J
TAN KAN
TAN KAN
Application Number:
JP2022128673A
Publication Date:
February 24, 2023
Filing Date:
August 12, 2022
Export Citation:
Assignee:
TEKTRONIX INC
International Classes:
G01R13/20
Attorney, Agent or Firm:
Hiroshi Arafune
Yoshio Arafune
Yoshio Arafune
Previous Patent: JPWO2023026401
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