Title:
TEST MEASURING DEVICE AND METHOD FOR SUPPLYING DATA COMPRESSION
Document Type and Number:
Japanese Patent JP2023011538
Kind Code:
A
Abstract:
To allow an irreversible compression of waveform data of a test measuring device.SOLUTION: A test measuring device 10 is connected to a test target device 26 and generates waveform data. The device specifies a data format of the waveform data in response to a user input through a user interface 20, and compresses the waveform data according to the data format. Since the resolution of a display 22 (an example of an internal client) is lower than that of obtainable waveform data in a case where an instruction displayed by the whole waveform is received by the user input, the waveform data is converted to compressed data which was thinned out according to the resolution and is sent to a display memory 23 so that the processing rate is increased. Since the waveform data is compressed data, the transmission rate is also increased when the data is sent to an outside client 24.SELECTED DRAWING: Figure 1
Inventors:
KEITH D RULE
Application Number:
JP2022111535A
Publication Date:
January 24, 2023
Filing Date:
July 12, 2022
Export Citation:
Assignee:
TEKTRONIX INC
International Classes:
G01R13/20
Attorney, Agent or Firm:
Hiroshi Arafune
Yoshio Arafune
Yoshio Arafune