Title:
TEST METHOD FOR SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP3444902
Kind Code:
B2
Abstract:
PURPOSE: To guarantee the life by first performing the rewrite guarantee test and taking two groups, namely, the group for rewrite operation and the group for data holding power as the object to check the read/write operation of the former group and the read operation of the latter at an intermediate point of time.
CONSTITUTION: Samples extracted from a product group of a rewritable semiconductor device like an EEPROM or a flash EPROM are subjected to 10000-rewrite guarantee test. These samples are divided into two groups for rewrite operation and data holding power. The group for rewrite operation is subjected to the general life test for guarantee of 10-year life, and at this time, the read operation is checked at several intermediate points of time. These two groups for rewrite operation and data holding power which are subjected to the general life test are subjected to 10000-rewrite guarantee test again. Thus, the practical guarantee test is performed to surely guarantee the life of the semiconductor device, the frequency in rewrite of data, and the data holding power.
Inventors:
Masaki Nagasawa
Application Number:
JP27748891A
Publication Date:
September 08, 2003
Filing Date:
October 24, 1991
Export Citation:
Assignee:
富士通株式会社
International Classes:
G01R31/28; G11C29/00; G11C29/06; G11C29/56; H01L21/66; G01R31/26; (IPC1-7): G11C29/00; G01R31/26; G01R31/28; H01L21/66
Domestic Patent References:
| JP5611371A | ||||
| JP1154399A | ||||
| JP547894A |
Attorney, Agent or Firm:
Yoshito Kitano
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