Title:
TEST PROBE AND TEST PROBE TIP
Document Type and Number:
Japanese Patent JP2019086519
Kind Code:
A
Abstract:
To improve properties of a test probe tip.SOLUTION: A resistive element 600 for a resistive element suitable for use in test probe tip has one end coupled electromechanically with a tip component, and another end coupled electromechanically with a plunger base component. Both the ends of the resistive element 600 have respective metallic layers 604a and 604b. A resistive layer 606 is formed ranging from a peripheral surface of a structural member 602 of the resistive impedance element 600 to portions of surfaces of the metallic layers 604a and 604b.SELECTED DRAWING: Figure 6
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Inventors:
JULIE A CAMPBELL
HAGERUP WILLIAM A
POLLOCK IRA G
CHRISTINA D ENNS
JAMES E SPINAR
KATHLEEN F M ULLOM
CHARLES M HARTMANN
AYRES DANIEL J
HAGERUP WILLIAM A
POLLOCK IRA G
CHRISTINA D ENNS
JAMES E SPINAR
KATHLEEN F M ULLOM
CHARLES M HARTMANN
AYRES DANIEL J
Application Number:
JP2018209767A
Publication Date:
June 06, 2019
Filing Date:
November 07, 2018
Export Citation:
Assignee:
TEKTRONIX INC
International Classes:
G01R1/067
Domestic Patent References:
| JP2016126018A | 2016-07-11 |
Foreign References:
| US20180059139A1 | 2018-03-01 |
Attorney, Agent or Firm:
Yamaguchi International Patent Office