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Patent Searching and Data


Title:
TESTING CIRCUIT OF OVERCURRENT PROTECTION DEVICE
Document Type and Number:
Japanese Patent JPH06284551
Kind Code:
A
Abstract:

PURPOSE: To perform an online test economically.

CONSTITUTION: The current of respective phase is fed to analog OR-circuit 11a-11c, and in the case of an operation, the magnitude of the current signals is decided by a microprocessor 6, and whether an abnormality arises or not is decided. In the case of a test, to the analog OR-circuit of the phase to be tested, a testing signal is fed too, and the signal having the larger level than the ones of the other two phases is outputted for the test of the phase to be performed. But, since the current of the other two phases is monitored, an on-line test can be performed.


Inventors:
KOBAYASHI TETSUJI
Application Number:
JP6996593A
Publication Date:
October 07, 1994
Filing Date:
March 29, 1993
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
H02H3/05; (IPC1-7): H02H3/05
Attorney, Agent or Firm:
Takada Mamoru