To provide a testing device and testing method for finding abnormalities of the needle of a probe.

This testing device comprises a substrate-mounting stand 5, a probe card 7 having the probe 8 for providing a test signal to a wafer W mounted on the substrate mounting stand 5, an imaging section 4 for acquiring an image of the probe 8, and a determination section 9 for determining whether the needle of the probe 8 is abnormal, based on difference in image of the probe 8 before and after testing.