Title:
TESTING DEVICE FOR NONCONTACT IC CARD
Document Type and Number:
Japanese Patent JP2007156509
Kind Code:
A
Abstract:
To enhance precision in initial defective detection by carrying out a burn-in test of a noncontact IC card under a condition close to an actual using condition.
This testing device is provided with a sample block 2 mounted with the noncontact IC card 1, and a coiled antenna 4 arranged opposedly to the sample block 2, and carries out the burn-in test of the noncontact IC card 1 under the condition where the noncontact IC card 1 is driven by electrifying the coiled antenna 4. In the testing device, the sample block 2 is supported rotatably with respect to a coil face of the coiled antenna 4.
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Inventors:
IKEDA YOSHIHIRO
Application Number:
JP2005346315A
Publication Date:
June 21, 2007
Filing Date:
November 30, 2005
Export Citation:
Assignee:
FUJITSU LTD
International Classes:
G06K17/00; B42D15/10
Attorney, Agent or Firm:
Junichi Yokoyama