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Title:
TESTING METHOD FOR EQUIVALENT TEMPERATURE RISE OF LARGE-CAPACITANCE CAPACITOR
Document Type and Number:
Japanese Patent JPS58168973
Kind Code:
A
Abstract:

PURPOSE: To reduce the size of facilities and to realize space reduction and economization, by incorporating an equivalent resistor for generating heat equivalent to heat loss generated in a large-capacitance capacitor device, in the tank of said device.

CONSTITUTION: The resistor 16 for generating heat equivalent to heat loss generated in the large-capacitance capacitor device 3 is stored in the tank of the device 3. During a test of a temperature rise, a changeover switch 17 is connected to the resistor 16, and during the operation of the device 3, the switch 17 is connected to a capacitor body 1. Consequently, the need for a compensating reactor in temperature rise testing facilities is eliminated, an inductive voltage regulator and a testing transformer are reduced in capacitance, and electric power is saved.


Inventors:
YOSHIDA YASUNOBU
Application Number:
JP5303282A
Publication Date:
October 05, 1983
Filing Date:
March 30, 1982
Export Citation:
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Assignee:
NISSIN ELECTRIC CO LTD
International Classes:
G01R31/00; G01R31/01; (IPC1-7): G01R31/00



 
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