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Patent Searching and Data


Title:
THICKNESS MEASUREMENT DEVICE
Document Type and Number:
Japanese Patent JP2012117940
Kind Code:
A
Abstract:

To provide a thickness measurement device capable of measuring thickness of various plate-like objects without replacing a measuring head of an air micrometer, and efficiently measuring thickness at multiple positions of the plate-like object.

The thickness measurement device performs measurement by an air micrometer. A horizontally moving unit 22 having a horizontally moving body 24 which moves horizontally on a surface plate 21 is mounted on the surface plate. A head body 2 of a measuring head 1 of the air micrometer is fixed on the horizontally moving body 24, and a fixed nozzle part 3 having an injection hole is fixed to the head body 2 of the measuring head 1. A movable nozzle part 4 having an injection hole is attached so as to face the fixed nozzle part 3 and be slidable in an approaching and separating direction via a slide mechanism 6. A micrometer head 10 is attached with a moving tip thereof abutting against the head body 2, so as to make the movable nozzle part 4 move slightly in the approaching and separating direction relative to the head body 2 and the fixed nozzle part 3.


Inventors:
UMETANI MASAAKI
Application Number:
JP2010268680A
Publication Date:
June 21, 2012
Filing Date:
December 01, 2010
Export Citation:
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Assignee:
TOKAI KYOHAN KK
International Classes:
G01B13/06
Domestic Patent References:
JP2010243185A2010-10-28
JP2002228436A2002-08-14
JPH063219A1994-01-11
JP2001304848A2001-10-31
JPH07134018A1995-05-23
JPH10318736A1998-12-04
Foreign References:
WO2008035438A12008-03-27
US4941269A1990-07-17
Attorney, Agent or Firm:
Akio Iida
Michiko Ema
Chiori Ueda
Takaya Muramatsu