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Title:
TIME INTERVAL MEASURING APPARATUS
Document Type and Number:
Japanese Patent JPH0854481
Kind Code:
A
Abstract:

PURPOSE: To measure the time interval with a resolution of less than one several-th of a reference clock by connecting a plurality of unit delay elements in series, setting the entire delay time several times or more as large as the reference clock, providing a latch circuit for every element, and measuring the time interval from the transient position information of the data.

CONSTITUTION: A reference clock 71 is so set as to allow the relationships among a period time Tt, the delay time Td of a unit delay element 22n to satisfy Tt=K × Td+ΔT (K: integer number), and supplies the reference clock. A unit delay detector 20n latches the delay times of n pieces of elements 22a-22n. Accordingly, the entire delay time becomes Tdly=n × Td. An encoder 30 inputs latch signals 24Qa-24Qn from FF 24a-FF 24n, detects the rise and fall transient positions of the signals, converts it into a binary signal, and supplies it to a data recorder 40. An arithmetic processing part 44 determines Tdly>Tt × (Td/ΔT)=Tt× Q (Q: resolution magnification) from the data, and measures the time interval with the ΔT as the measuring resolution.


Inventors:
FURUKAWA YASUO
Application Number:
JP21050594A
Publication Date:
February 27, 1996
Filing Date:
August 10, 1994
Export Citation:
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Assignee:
ADVANTEST CORP
International Classes:
G04F10/04; G01R23/10; G01R29/02; H03K21/02; (IPC1-7): G04F10/04; G01R23/10; G01R29/02; H03K21/02



 
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