Title:
SEMICONDUCTOR INTEGRATED CIRCUIT
Document Type and Number:
Japanese Patent JPS595634
Kind Code:
A
Abstract:
PURPOSE:To execute an aging test efficiently by a substrate for the aging test of simple structure by arranging signal input/output terminals, from which signals must be applied on the aging test, on one side of a package. CONSTITUTION:With an integrated circuit 1 to which input signals A, B, C and supply voltage must be applied on an aging test, these signal input terminals are disposed only on one side of the package. The signal input/output terminals S1 only on one side of the integrated circuit 1 are fitted to IC sockets 3 as IC sockets, and signal input/output terminals S2 on one side are brought previously to an open state. The structure of the IC sockets 3 are also simplified, their shapes are also miniaturized, and their numbers mounted to the substrate 2 for the aging test are increased. Work is facilitated because only the signal input/ output terminals only on one side are fitted.
More Like This:
| JPH0629301 | TESTING METHOD FOR SEMICONDUCTOR DEVICE |
| JPS62166284 | HEATING FURNACE |
Inventors:
KIYOHARA HIROYUKI
Application Number:
JP11597882A
Publication Date:
January 12, 1984
Filing Date:
July 01, 1982
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
H01L21/326; (IPC1-7): H01L23/00
Attorney, Agent or Firm:
Shinichi Kusano
Next Patent: JPS595635