Title:
【発明の名称】伸び計読出し回路
Document Type and Number:
Japanese Patent JPS59501801
Kind Code:
A
Abstract:
An extensometer readout circuit conditions a strain information signal, representing strain of a specimen being tested, in such a way that yield point measurements and final elongation measurements of such specimen may be concurrently obtained. The strain information signal is provided by subjecting the specimen to a tensile or compression test by any conventional means known in the prior art. The strain information signal is first applied to a preamplifier. The preamplified strain information signal is then concurrently applied to both a high gain amplifier and a low gain amplifier. The signal obtained from the high gain amplifier is used for performing modulus calculations and for obtaining yield point measurements. The signal obtained from the low gain amplifier is used to obtain the total elongation measurement.
Inventors:
What's Debited
Winter's Donkey-Dubrillu-
Winter's Donkey-Dubrillu-
Application Number:
JP50331983A
Publication Date:
October 25, 1984
Filing Date:
September 21, 1983
Export Citation:
Assignee:
MT Systems Systems Corporation
International Classes:
G01B5/30; G01B7/16; G01B21/32; (IPC1-7): G01B7/16; G01B21/32
Attorney, Agent or Firm:
Kyozo Yuasa