Title:
【発明の名称】低真空質量分析計
Document Type and Number:
Japanese Patent JP2000500275
Kind Code:
A
Abstract:
PCT No. PCT/IL96/00149 Sec. 371 Date Jul. 29, 1998 Sec. 102(e) Date Jul. 29, 1998 PCT Filed Nov. 13, 1996 PCT Pub. No. WO97/18579 PCT Pub. Date May 22, 1997The invention provides a low-vacuum mass specrometer for use as gas analyzer, including a drift tube having a gas inlet and an ionization region at one end thereof, a power source for supplying the required high tension, a vacuum pump connectable to the drift tube to maintain a level of vacuum of up to 1 Torr, and a detector located at the other end of the drift tube, wherein the detector is a multisphere plate comprised of a multilayer arrangement of beads bonded together in a substantially close-packing order.
Inventors:
Naaman, Ron
Weiger, Jive
Weiger, Jive
Application Number:
JP51872297A
Publication Date:
January 11, 2000
Filing Date:
November 13, 1996
Export Citation:
Assignee:
Yeda Research and Development Company Limited
International Classes:
H01J43/22; H01J49/02; H01J49/06; H01J49/40; G01N27/62; (IPC1-7): H01J49/06; G01N27/62; H01J49/40
Attorney, Agent or Firm:
Kensuke Isshiki (2 outside)