Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
FREQUENCY MEASURING APPARATUS
Document Type and Number:
Japanese Patent JPS6053854
Kind Code:
A
Abstract:

PURPOSE: To attain to enhance the efficiency of measuring work by shortening a frequency measuring time of a receiving signal, by calculating the frequency value of an offset signal inputted to a signal synthesizer part by using a frequency synthesizer.

CONSTITUTION: A signal (a) with unknown frequency f1 received by an antenna 1 is applied to a signal synthesizer part 2 and synthesized with an offset signal (b) with frequency f2 from a frequency synthesizer 11 and both signals are inputted to a receiving part as a beat wave form synthetic associated wave (c). The output of a detector 5b is applied to the vertical axis input of a CRT part 6 as a signal (d) with difference frequency f3 of f1 and f2. A reference signal (e) with frequency f4 from a reference frequency generator 7 is inputted to the external sweep input terminal of the CRT part 6. As a result, a Lissajous' figure is displayed on CRT.


Inventors:
SASAO KOUICHI
Application Number:
JP16147183A
Publication Date:
March 27, 1985
Filing Date:
September 02, 1983
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
ANRITSU ELECTRIC CO LTD
International Classes:
G01R23/02; (IPC1-7): G01R23/02
Domestic Patent References:
JP28001791A
JP26003941A
Attorney, Agent or Firm:
Takehiko Suzue