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Patent Searching and Data


Title:
SAMPLE POSITION CONTROLLER OF ELECTRON MICROSCOPE
Document Type and Number:
Japanese Patent JPH0613011
Kind Code:
A
Abstract:

PURPOSE: To facilitate selection of a desired visual field by taking a sample in and by displaying it as a TV image by an optical camera device, and by having its coordinates corresponded to the coordinates of a sample stage of an electron microscope having a readable stage.

CONSTITUTION: The intersection of X-axis and Y-axis is determined on a sample stage 4 on the lower part of a scanning electron microscope cylinder 1, and the point becomes an origin of coordinates. Specific points A, B, C are determined on the X and Y axes for a sample 3 on a sample holder 2 on the stage 4, and their coordinates are thus found. The sample 3 is displayed by a display device 6 of an optical camera device 5, and is stored in an image intake memory part 7. Cross coordinate axes are drawn on the device 6, and the stage 4 of the electron microscope corresponds with an image screen by giving coordinates of each point on X and Y axes for the specific points A, B, C. The coordinates of optional points on the device 6 are read and the stage 4 is moved, thereby observation is facilitated by means of the electron microscope image.


Inventors:
ONO TERUAKI
KATAGIRI SHINJIRO
Application Number:
JP36091591A
Publication Date:
January 21, 1994
Filing Date:
December 12, 1991
Export Citation:
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Assignee:
DENSHI KOGAKU KENKYUSHO KK
International Classes:
H01J37/20; H01J37/22; H01J37/28; (IPC1-7): H01J37/20; H01J37/22; H01J37/28