Title:
【発明の名称】物質濃度測定用X線蛍光放射分析
Document Type and Number:
Japanese Patent JP2002533674
Kind Code:
A
Abstract:
A method and apparatus determine a concentration of dopant in soot that constitutes at least a portion of a soot preform used to form an optical waveguide. The soot is irradiated with photons, X-ray fluorescent emissions from the irradiated soot are detected, and the concentration of dopant is determined based on the detected X-ray fluorescent emissions. Additionally, the concentration of dopant in layers of soot on the soot preform can be individually determined. Furthermore, the manufacture of the soot preform can be controlled by utilizing the detected X-ray fluorescent emissions to determine a deviation between a concentration of dopant in the soot and a predetermined concentration, and adjusting deposition conditions based on the deviation.
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Inventors:
Quinn Alanpie.
Application Number:
JP2000589938A
Publication Date:
October 08, 2002
Filing Date:
December 06, 1999
Export Citation:
Assignee:
Corning Incorporated
International Classes:
C03B37/018; G01N23/223; (IPC1-7): G01N23/223; C03B37/018
Attorney, Agent or Firm:
Fujihiko Motohiko