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Patent Searching and Data


Title:
MEASURING METHOD FOR MINUTE DEFORMATION
Document Type and Number:
Japanese Patent JPS5828606
Kind Code:
A
Abstract:

PURPOSE: To realize a simple optical measurement for a minute deformation, by deforming the surface of a sample to be measured into a concave or convex surface and then detecting the interference fringes which are caused by irradiating the coherent light to the deformed surface of the sample.

CONSTITUTION: A sample 1 has a mirror surface having the reduced diffused reflection with a deformed concave face. The coherent light beams 2 and 3 are projected to the surface of the sample 1, and a screen is set at the point H where the reflected beams cross to each other. Thus the interference fringes are caused to show the concave and convex contour lines. So is with the convex deformation caused on the surface of the sample 1. As a result, a minute deformation can be measured in a simple and optical way.


Inventors:
KUMAZAWA TETSUO
SAKAMOTO TATSUJI
Application Number:
JP12666081A
Publication Date:
February 19, 1983
Filing Date:
August 14, 1981
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
G01B11/16; G01B11/24; G01B11/30; (IPC1-7): G01B11/30
Attorney, Agent or Firm:
Tatsuyuki Unuma (2 others)