PURPOSE: To make it possible to perform continuous measurement of thickness for a broad range, by moving a thickness measuring device back and forth, with a position, immediately before film sheet comes out of both edges, as a returning point.
CONSTITUTION: A thickness measuring device 7 for film sheet 1 is constituted by a radiation source part 5 having a radiation source 4 and a measuring part 6. The measuring device 7 is moved back and forth in the direction perpendicular to the conveying line of the sheet 1. Thus the thickness along a scanning locus L2 is measured. In this case, first and second photoelectric sensors 12 and 13 are arranged in the vicinities of the right and left of the radiation source 4. The measuring device 7 is moved back and forth, with a point, immediately before the radiation source 4 comes out of the sheet 1, as a returning point. In this way, the continuous measurement for the broad range to the vicinities of both edges can be performed regardless of the snaking of the sheet 1.
WADA HARUO
ITOU NORIMICHI
| JPS5067669A | 1975-06-06 |