PURPOSE: To detect eccentricity or unbalanced thickness, by projecting light beams to an optical fiber strand, receiving the forward scattered light and the projected beams by the same photodiode arrays, sweeping the output signals, and obtaining the ratio of the right and left thicknesses of a coated layer.
CONSTITUTION: Light beams are projected from light sources 2 of semiconductor lasers to an optical fiber strand 1 that is being coated from the two directions of the X axis and the Y axis through lenses 3. The forward scattered light and the projected light beams are detected by the same photodiode arrays 4. Attenuating filters 5 are provided in front of the part, into which the projected beams are inputted. The output signals of the arrays 4 are sent to a processors 6. The signals are swept by a frequency of about 100Hz and converted into continuous pulse waveform signals in a time region. At every one sweep, rise-up and fall-down of the waveform are detected, and the right and left thicknesses of the coated layer are obtained. The ratio of the thickness in the two directions of the X axis and the Y axis is obtained. Thus the eccentricity and the unbalanced thickness is measured.
NISHIMURA MASAYUKI
SUZUKI SHUZO
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