Title:
再構成されたスペクトルを用いた２次元多層厚測定
Document Type and Number:
Japanese Patent JP6991267
Kind Code:
B2
Abstract:
A method for determining thickness of layers of the tear film includes reconstructing a full- or hyper-spectral interference pattern from an imaged multi-spectral pattern. Tear film thickness can then be estimated from the full- or hyper-spectral interference pattern. Using a full- or hyper-spectral interference pattern provides a greater number of frequency sampling points for increased tear film thickness estimation accuracy, without traditional time consuming techniques.
Inventors:
Mao Zaishin
Wang Zengu
Khao Bin
Chan Kimpui
Wang Zengu
Khao Bin
Chan Kimpui
Application Number:
JP2020077005A
Publication Date:
January 12, 2022
Filing Date:
April 24, 2020
Export Citation:
Assignee:
Topcon Co., Ltd.
International Classes:
A61B3/10
Domestic Patent References:
| JP2007534945A | ||||
| JP2015091322A | ||||
| JP2018149283A | ||||
| JP2008109640A | ||||
| JP2012154711A |
Foreign References:
| US20100253907 |
Other References:
P. Ewen King-Smith, et al.,Tear Film Interferometry and Corneal Surface Roughness,Investigative Ophthalmology & Visual Science,2014年,Vol.55, Issue 4,pp.2614-2618
Attorney, Agent or Firm:
Tomokazu Enonami