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Title:
USE OF TOP LAYER OF MIRROR USED IN LITHOGRAPHY APPARATUS, MIRROR FOR USE IN LITHOGRAPHY APPARATUS, LITHOGRAPHY APPARATUS EQUIPPED WITH SUCH MIRROR, AND METHOD OF MANUFACTURING THE DEVICE
Document Type and Number:
Japanese Patent JP2005129936
Kind Code:
A
Abstract:

To provide a use of a top layer 8 of predetermined metal on a mirror used in lithography apparatus, a mirror for use in lithography apparatus, and a lithography apparatus having such a mirror or a mirror equipped with a top layer for use in lithography apparatus.

The apparatus has a radiation source SO which provides a radiation of desired wavelength such as EUV. The radiation source SO generates a stream of undesired metallic particles that are deposited on a mirror, forming relatively small and large nuclei thereon. The metal of the top layer 8 and the nuclei of the deposited metal may interdiffuse in a predetermined range of the temperature. As a result, an alloy layer 14 consisting of these metallic particles and the metal of the top layer 8 is formed additionally on the top layer 8. The reflectivity of the additional alloy layer is higher than that of a layer comprising solely the metallic particles.


Inventors:
BAKKER LEVINUS PIETER
SCHUURMANS FRANK JEROEN PIETER
Application Number:
JP2004304405A
Publication Date:
May 19, 2005
Filing Date:
October 19, 2004
Export Citation:
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Assignee:
ASML NETHERLANDS BV
International Classes:
G02B1/00; G02B1/10; G02B5/08; G03F7/20; G21K1/06; G21K5/00; H01L21/00; H01L21/027; G03F1/24; (IPC1-7): H01L21/027; G02B5/08; G21K1/06; G21K5/00
Domestic Patent References:
JP2001523007A2001-11-20
JP2003142296A2003-05-16
JP2002319537A2002-10-31
JP2003516643A2003-05-13
JPH08236292A1996-09-13
JP2005522839A2005-07-28
Foreign References:
WO2003087867A22003-10-23
EP1348984A12003-10-01
WO1999063790A11999-12-09
Attorney, Agent or Firm:
Hideto Asamura
Hajime Asamura
Toru Mori
Yukio Iwamoto