Title:
垂直型テスト装置及びそのシート状プローブ
Document Type and Number:
Japanese Patent JP7001773
Kind Code:
B2
Abstract:
The present invention discloses a vertical test device capable of effectively improving on the issues that may occur in conductive probes of a conventional vertical test device, and a sheet-type probe thereof. The sheet-type probe includes a sheet body, a first contact portion, a stroke portion, and a second contact portion. The sheet body has a length in a lengthwise direction and a thickness in a thickness direction perpendicular to the lengthwise direction, and the ratio of the length to the thickness is between 25 and 85. The first contact portion extends from the upper edge of the sheet body. The stroke portion extends from the lower edge of the sheet body to be bent in a direction away from the sheet body, wherein the stroke portion receives a force, and the stroke portion is deformed to have a spring force. The second contact portion extends from an end edge of the stroke portion away from the sheet body.
Inventors:
Lee Wen Satoshi
Wei Liaotai
Li Xiao
Ding Wataru
Wei Liaotai
Li Xiao
Ding Wataru
Application Number:
JP2020129095A
Publication Date:
February 10, 2022
Filing Date:
July 30, 2020
Export Citation:
Assignee:
CHUNGHWA PRECISION TEST TECH.CO.,LTD
International Classes:
G01R1/073
Domestic Patent References:
| JP2006284297A | ||||
| JP2017122686A | ||||
| JP2018513389A |
Foreign References:
| US20060066328 | ||||
| US20020155735 | ||||
| US6278284 | ||||
| US20090102495 | ||||
| US5977787 | ||||
| US20140352460 | ||||
| US20190041430 |
Attorney, Agent or Firm:
Shigeru Kinoshita