Title:
VIBRATION TEST METHOD, VIBRATION TEST PROGRAM, AND VIBRATION TEST DEVICE
Document Type and Number:
Japanese Patent JP2017125824
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a vibration test method, vibration test program, and vibration test device capable of certainly determining occurrence of abnormality in a test piece with an existing facility without increasing the testing cost and testing man hour.SOLUTION: A vibration test method, vibration test program, and vibration test device for testing a test piece by repeatedly charging a load on the test piece measures a vibration signal waveform of the test piece, measures an output signal waveform indicating the stress at an output point of the test piece or the temporal change in strain, calculates the skewness of the measured vibration signal waveform, calculates the skewness of the measured output signal waveform, and determines whether abnormality occurs in the test piece, on the basis of the correlation between the calculated skewness of the vibration signal waveform and the calculated skewness of the output signal waveform.SELECTED DRAWING: Figure 7
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Inventors:
OKUYAMA MASAKI
MORITA SATOSHI
MORITA SATOSHI
Application Number:
JP2016006521A
Publication Date:
July 20, 2017
Filing Date:
January 15, 2016
Export Citation:
Assignee:
YANMAR CO LTD
International Classes:
G01N3/34
Attorney, Agent or Firm:
Patent Business Corporation Ark Patent Office