To provide a visual inspection device which can efficiently inspect outward appearance of six surfaces comprising upper/lower surfaces and four side surfaces of a chip part.

A sucking head is provided respectively in a plurality of moving units 5 rotating on its own axis by each prescribed angle associated with movement rotating around at a prescribed angle, a chip part P, while rotating it on its own axis, is moved to rotate around. After an upper surface image of the chip part on a feeder 2 is photographed by a first camera 7a, a side surface image of the chip part P conveyed to be held by each of the sucking head is photographed by second to fifth cameras 7b, 7c, 7d, 7e. A lower surface image of the chip part P is photographed by a sixth camera 7f, and a quality of the chip part P is successively decided. Release timing of the chip part P from each of the sucking head is selectively controlled in accordance with this image processing result.