Title:
外観検査システム
Document Type and Number:
Japanese Patent JP7410402
Kind Code:
B2
Abstract:
An appearance inspection system (100) comprises a primary inspection unit (10) and a secondary inspection unit (20). On the basis of captured images of an object, the primary inspection unit (10) carries out defect determination without using mechanical learning. On the basis of images of an object which was determined to be defective by the primary inspection unit (10), the secondary inspection unit (20) differentiates between an actual defective product and a mistakenly-determined-to-be-defective product, using a first mechanical learning model (21).
Inventors:
Toshiro Kuroe
Application Number:
JP2020082753A
Publication Date:
January 10, 2024
Filing Date:
May 08, 2020
Export Citation:
Assignee:
Daikin Industries, Ltd.
International Classes:
G01N21/956; G06T7/00
Domestic Patent References:
| JP6653929B1 | ||||
| JP8136466A | ||||
| JP2004294360A | ||||
| JP2020030145A | ||||
| JP2020187657A | ||||
| JP2018205123A |
Foreign References:
| WO2020071234A1 | ||||
| WO2020031984A1 | ||||
| US20190318471 | ||||
| CN110992329A |
Attorney, Agent or Firm:
Patent Attorney Corporation Maeda Patent Office