Title:
WAVE-FORM SHAPING CIRCUIT FOR SEMICONDUCTOR TEST DEVICE
Document Type and Number:
Japanese Patent JP3492792
Kind Code:
B2
Abstract:
PURPOSE: To generate the nonreturn-to-zero(NRZ) wave-form having a quick cycle from the shaping section output by inputting the pattern generator output to a programmable data selector, outputting both patterns corresponding to both timing signals, and controlling the input of both signals to the wave-form shaping section with a prohibiting circuit.
CONSTITUTION: Timing signals ACLK, BCLK are generated by a timing generator 10, and a programmable data selector 22 generates the patterns PATA, PATB corresponding to both signals outputted from a pattern generator 11. A prohibiting circuit 26 outputs the signals ENBA, ENBB controlling the input of the signals ACLK, BCLK to a wave-form shaping section 23. The shaping section 23 receives the signals ACLK, BCLK, ENBA, ENBB and the patterns PATA, PATB and outputs signals ST, RST. An SRFF 15 is set or reset by the signals ST1, RST1 processed with signals ST, RST by two trailing edge differentiating circuits 14 to form the NRZ wave-form.
Inventors:
Koichi Ebitani
Application Number:
JP33607594A
Publication Date:
February 03, 2004
Filing Date:
December 22, 1994
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R31/319; H03K5/1252; H03K19/00; G01R31/28; H03M5/06; (IPC1-7): G01R31/28; H03K19/00; H03M5/06
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