Title:
WAVELENGTH MEASURING INSTRUMENT, LIGHT RECEIVING UNIT, AND WAVELENGTH MEASURING METHOD
Document Type and Number:
Japanese Patent JP3892422
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a wavelength measuring instrument, a light-receiving unit and a wavelength measuring method for capable of easily realizing high precision wavelength characteristics, in a desired wavelength range.
SOLUTION: A temperature control means, including a Peltier element 20, controls the peak wavelength of the sensitivity curve in a photoreception chip 10 on the light receiving unit 1a side to the side of wavelength shorter than the desired wavelength region, and controls a peak wavelength of a sensitivity curve in the light receiving chip 10 in a light receiving unit 1b side to the side of wavelength longer than the desired wavelength range, by respectively temperature-controlling the light receiving unit 1a and the light receiving unit 1b independently. A wavelength specifying range is set thereby, to include the desired wavelength range, and the wavelength of measured light 3 is specified accurately in the wavelength range.
Inventors:
Ono Haruyoshi
Application Number:
JP2003207222A
Publication Date:
March 14, 2007
Filing Date:
August 11, 2003
Export Citation:
Assignee:
Udina Device Co., Ltd.
International Classes:
G01J9/00; G01J1/02; G01J3/02; G01J3/36; H01J40/14; H01L31/10; H01S3/093; (IPC1-7): G01J9/00; G01J1/02; G01J3/36; H01L31/10
Domestic Patent References:
| JP6058817A | ||||
| JP2001995A | ||||
| JP6076830U | ||||
| JP2002340688A |
Attorney, Agent or Firm:
Shuhei Katayama