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Title:
WINDING METHOD FOR SEMICONDUCTOR DEVICE BONDING WIRE
Document Type and Number:
Japanese Patent JPH11124276
Kind Code:
A
Abstract:

To provide a winding method for semiconductor device bonding wire whereby possible collapse of winding due to vibration is prevented.

A bonding wire is wound on the cylindrical barrel part 3 of a spool at a winding width of L1 so as to form a first winding layer 1, and further wound on the first winding layer at a winding width L2 larger than the winding width L1 so as to form a second winding layer 2. Also it is wound on the second winding layer 2 at a winding width L3 larger than the winding width L2 of the second winding layer 2 so as to form a third winding layer 3. In the same manner, with a winding width increased more as a winding layer is later, the bonding wire is wound in multiple winding layers so that a relation of L1<L2<L3... can be obtained.


Inventors:
FURUKAWA KIYOSHI
YAMAMOTO TAKAO
Application Number:
JP29114197A
Publication Date:
May 11, 1999
Filing Date:
October 23, 1997
Export Citation:
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Assignee:
MITSUBISHI MATERIALS CORP
International Classes:
B65H54/02; H01L21/60; (IPC1-7): B65H54/02; H01L21/60
Attorney, Agent or Firm:
Kazuo Tomita (1 person outside)



 
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