Title:
X-RAY ANALYZER
Document Type and Number:
Japanese Patent JPS6040943
Kind Code:
A
Abstract:
In an X-ray analysis apparatus a movement mechanism is equipped with a main guide (7) along which a main slide (9) can be displaced. Rotating with the main slide, a detection guide (15) is incorporated along which a detection holder (5) can be displaced. The main slide (9), as well as the detection slide (51) and a point of focus (30) are connected to a central axis (27), together with each of the arms which can rotate both with them and mutually. The main slide and the detector slide can each be equipped with a drive motor (11), in which respect the motor for the main slide is preferably driven first and the motor for the detector slide is driven by signals derived from the displacement of the main slide. The rotatable arms (19, 21, 25) ensure an optimum orientation of a crystal holder (3) incorporated in the main slide (9) and a detection holder (5) incorporated in the detector slide (51) with respect to each other and with respect to a point of focus (30).
Inventors:
PEETAA BURINKUGUREEBE
DEIIDERITSUKU KURISUTEIAAN KOO
DEIIDERITSUKU KURISUTEIAAN KOO
Application Number:
JP4826184A
Publication Date:
March 04, 1985
Filing Date:
March 15, 1984
Export Citation:
Assignee:
EINDHOVEN TECH HOGESCHOOL (NL)
International Classes:
G01N23/223; G01N23/20; G01N23/207; G21K1/06; (IPC1-7): G01N23/223
Domestic Patent References:
| JPS59124348U | 1984-08-21 | |||
| JP47047838A |
Attorney, Agent or Firm:
Akihide Sugimura