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Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2007292497
Kind Code:
A
Abstract:

To provide a means capable of efficiently cooling the inside of an X-ray inspection device for inspecting an article using X rays, while preventing the leakage of X rays emitted from an X-ray source to the outside.

The X-ray inspection device includes the X-ray source (2) for emitting X rays and the device wall (41) for surrounding the X-ray source (2) to hermetically seal the same. An internal heat conductor (43) is provided inside the device wall (41) and an outside heat conductor (44) for radiating the heat conducted from the internal heat conductor (43) via the device wall (41) is provided to the outside of the device wall (41).

COPYRIGHT: (C)2008,JPO&INPIT


Inventors:
UNO MASAYUKI
KABUMOTO TAKASHI
Application Number:
JP2006118125A
Publication Date:
November 08, 2007
Filing Date:
April 21, 2006
Export Citation:
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Assignee:
ISHIDA SEISAKUSHO
International Classes:
G01N23/04; H05G1/02; G21K5/00
Domestic Patent References:
JP2002175899A2002-06-21
JPH11183405A1999-07-09
JP2002341044A2002-11-27
JP2004022459A2004-01-22
JP2001318062A2001-11-16
Attorney, Agent or Firm:
Masanori Nakamura