Title:
X線検査システム
Document Type and Number:
Japanese Patent JP5094530
Kind Code:
B2
Abstract:
A solid-state image pickup apparatus 1A includes a photodetecting section 10A and a signal readout section 20 etc. In the photodetecting section 10A, M×N pixel units P 1,1 to P M,N are arrayed in M rows and N columns. When in a first imaging mode, a voltage value according to an amount of charges generated in a photodiode of each of the M×N pixel units in the photodetecting section 10A is output from the signal readout section 20. When in a second imaging mode, a voltage value according to an amount of charges generated in the photodiode of each pixel unit included in consecutive M 1 rows in the photodetecting section 10A is output from the signal readout section 20. When in the second imaging mode than when in the first imaging mode, the readout pixel pitch in frame data is smaller, the frame rate is higher, and the gain being a ratio of an output voltage value to an input charge amount in the signal readout section 20 is greater.
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Inventors:
Osamu Mori
Ryuji Hisashima
Kazuki Fujita
Ryuji Hisashima
Kazuki Fujita
Application Number:
JP2008114214A
Publication Date:
December 12, 2012
Filing Date:
April 24, 2008
Export Citation:
Assignee:
Hamamatsu Photonics Co., Ltd.
International Classes:
H04N5/374; A61B6/00; H01L27/14; H01L27/144; H01L27/146; H04N5/32; H04N5/335; H04N5/341; H04N5/376
Domestic Patent References:
| JP10285476A | ||||
| JP2007221453A | ||||
| JP2005184358A | ||||
| JP2001194458A |
Attorney, Agent or Firm:
Yoshiki Hasegawa
Shiro Terasaki
Satoru Ishida
Masatoshi Shibata
Shiro Terasaki
Satoru Ishida
Masatoshi Shibata