Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
X ray measuring device
Document Type and Number:
Japanese Patent JP6256152
Kind Code:
B2
Inventors:
Takao Marui
Keijiro Suzuki
Rie Ogawa
Kazuo Koyanagi
Application Number:
JP2014068561A
Publication Date:
January 10, 2018
Filing Date:
March 28, 2014
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SHIMADZU CORPORATION
International Classes:
G01N23/207; G01N23/223
Domestic Patent References:
JP2013104717A
JP2013181914A
JP56098641A
JP59186481A
JP6078913A
JP2003156565A
Foreign References:
US20130121460
Attorney, Agent or Firm:
Yoshio Kashima



 
Previous Patent: Mechanical pencil

Next Patent: ANTIPHLOGISTIC COSMETIC