Title:
The adjustment method of a microscope, and a microscope
Document Type and Number:
Japanese Patent JP6252876
Kind Code:
B2
Inventors:
Motoo Koyama
Yumiko Ouchi
Yumiko Ouchi
Application Number:
JP2016131493A
Publication Date:
December 27, 2017
Filing Date:
July 01, 2016
Export Citation:
Assignee:
NIKON CORPORATION
International Classes:
G02B21/10; G02B7/00
Domestic Patent References:
| JP200485796A | ||||
| JP2007334319A | ||||
| JP2009288321A | ||||
| JP201237911A | ||||
| JP2006285154A | ||||
| JP2006189741A |
Foreign References:
| US20020139936 |
Attorney, Agent or Firm:
Hoyo Joyo
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