The electron gun which was constituted for electron microscope methods and which is emitted under the high voltage

Title:

The electron gun which was constituted for electron microscope methods and which is emitted under the high voltage

Document Type and Number:

Japanese Patent JP6038794

Kind Code:

B2

Abstract:

A field-emission electron gun including an electron emission tip, an extractor anode, and a mechanism creating an electric-potential difference between the emission tip and the extractor anode. The emission tip includes a metal tip and an end cone produced by chemical vapor deposition on a nanofilament, the cone being aligned and welded onto the metal tip. The electron gun can be used for a transmission electron microscope.

More Like This:

JP3364970	INDUSTRIAL APPLICABILITY: Polarized electron beam generating element
JP2013521610	Electron beam generator and method of manufacturing it
JP2893742	[Title of Invention] Electron beam apparatus

Inventors:

Marc Montio
Florent Houdrière

Application Number:

JP2013528751A

Publication Date:

December 07, 2016

Filing Date:

September 16, 2011

Export Citation:

Click for automatic bibliography generation Help

Assignee:

Ecole Polytechnique/Dgar

International Classes:

H01J37/073; H01J1/304; H01J9/02

Domestic Patent References:

JP2007055856A
JP2009146705A
JP2006294481A
JP2007242253A
JP2003206116A

Attorney, Agent or Firm:

Atsushi Aoki
Tetsuro Shimada
Shinji Mitsuhashi
Hirose Shigeki
Kazuo Maejima
Masahiro Tahara

Previous Patent: A device for fixing a braid to a wiper

Next Patent: REFRESH CONTROL CIRCUIT