Title:
電子源
Document Type and Number:
Japanese Patent JP7238249
Kind Code:
B2
Abstract:
An electron source in a gas-source mass spectrometer the electron source comprising: an electron emitter cathode presenting a thermionic electron emitter surface in communication with a gas-source chamber of the gas-source mass spectrometer for providing electrons there to; a heater element electrically isolated from the electron emitter cathode and arranged to be heated by an electrical current therein and to radiate heat to the electron emitter cathode sufficient to liberate electrons thermionically from said electron emitter surface, therewith to provide a source of electrons for use in ionising a gas the gas-source chamber.
More Like This:
| WO/1987/001452 | MASS SPECTROSCOPE |
| JPS5825554 | [Title of the device] Ion source device |
| JP2013195152 | SECONDARY ION MASS SPECTROMETRY APPARATUS AND SECONDARY ION MASS SPECTROMETRY METHOD |
Inventors:
Tutel, Damien Paul
Jones, Anthony Michael
Jones, Anthony Michael
Application Number:
JP2020543409A
Publication Date:
March 14, 2023
Filing Date:
October 26, 2018
Export Citation:
Assignee:
ISOTOPX LTD
International Classes:
H01J49/14; G01N27/62; H01J1/142; H01J1/144; H01J1/20; H01J27/20
Domestic Patent References:
| JP2000340097A |
Foreign References:
| WO2014132357A1 |
Other References:
Kim F. Haselmann, et al.,Advantages of External Accumulation for Electron Capture Dissociation in Fourier Transform Mass Spectrometry,Analytical Chemistry,米国,American Chemical Society,2001年05月24日,Volume 73, Number 13,Page 2998-3005
Attorney, Agent or Firm:
Ikeda Adult
Junichiro Sakamaki
Masakazu Noda
Junichiro Sakamaki
Masakazu Noda