Title:
An examination probe assembly and a related method
Document Type and Number:
Japanese Patent JP6230595
Kind Code:
B2
Abstract:
A test probe assembly includes a first elongate electrically conductive plunger that extends from a proximal first plunger end to a distal first plunger end, and is defined in part by a central longitudinal axis. The first plunger has a first spring latch at the distal first plunger end. At least a portion of the first plunger has an arc with a first plunger outer contact point opposite the first spring latch relative to the longitudinal axis. The first plunger is disposed in a spring. The first plunger outer contact point in contact with the inner diameter of the spring, and the first spring latch engages at least a portion of the spring. A method includes disposing a first plunger within a spring along a spring longitudinal axis, disposing a second probe within the spring along the spring longitudinal axis, and engaging the spring latch and the second plunger spring latch with the spring, for instance by capturing an end coil of the spring with the spring latch of at least one of the spring latch or the second plunger spring latch.
Inventors:
Treybergs, Balz
Magnuson, Aaron
Yak chef, Sergey
Hanson, Scott
Magnuson, Aaron
Yak chef, Sergey
Hanson, Scott
Application Number:
JP2015505735A
Publication Date:
November 15, 2017
Filing Date:
March 14, 2013
Export Citation:
Assignee:
Excella Corporation
International Classes:
G01R1/067
Domestic Patent References:
| JP2011232181A | ||||
| JP2010539672A | ||||
| JP2008546164A | ||||
| JP201268134A |
Foreign References:
| WO2011036935A1 | ||||
| US6746252 |
Attorney, Agent or Firm:
Hidesaku Yamamoto
Natsuki Morishita
Takatoshi Iida
Daisuke Ishikawa
Kensaku Yamamoto
Natsuki Morishita
Takatoshi Iida
Daisuke Ishikawa
Kensaku Yamamoto
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