A manufacturing system of a defect inspection device and an optical display device, and a manufacture system of an optical sheet

Title:

A manufacturing system of a defect inspection device and an optical display device, and a manufacture system of an optical sheet

Document Type and Number:

Japanese Patent JP6179886

Kind Code:

B2

Inventors:

Ayako Sasamoto
Keita Imura

Application Number:

JP2013081214A

Publication Date:

August 16, 2017

Filing Date:

April 09, 2013

Export Citation:

Assignee:

Sumitomo Chemical Co., Ltd.

International Classes:

G01N21/892; G02F1/1335

Domestic Patent References:

Foreign References:

WO2003005007A1
US20040179193

Attorney, Agent or Firm:

Sumio Tanai
Naozumi Hiroyasu
Norihiko Ara
Hiroyuki Kato
Mitsunaga Igarashi

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