Title:
A marking apparatus, an inspection device, and an electrode manufacturing method
Document Type and Number:
Japanese Patent JP6103220
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a marking device capable of applying a mark which is not erased in the middle of manufacture of an electrode, to provide an inspection apparatus, and to provide an electrode manufacturing method.SOLUTION: A marking device 73 applies a mark N to an exposure part M, the mark N allowing the position of a defective portion K to be identified in first and second coating parts G1 and G2. The marking device 73 comprises a marking roller 77 which is rotated in slide-contact with a metal foil 25 for a negative electrode being conveyed, and comprises a support roller 78 which holds the metal foil 25 for the negative electrode with the marking roller 77. A circumferential surface of the marking roller 77 has a wavy shape where ruggedness is continued in a circumferential direction. The marking roller 77 is movable between a hold position P1 where the marking roller 77 is rotated while holding the metal foil 25 for the negative electrode with the support roller 78, and a separation position P2 separated from the metal foil 25 for the negative electrode. The marking device 73 then forms the mark N in a rugged shape without breaking the exposure part M in a thickness direction by means of the marking roller 77.
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Inventors:
Fumitaka Hayakawa
Application Number:
JP2013127626A
Publication Date:
March 29, 2017
Filing Date:
June 18, 2013
Export Citation:
Assignee:
KABUSHIKI KAISHA TOYOTA JIDOSHOKKI
International Classes:
H01G11/70; H01G11/84; H01G13/00; H01M4/04
Domestic Patent References:
| JP2009083006A | ||||
| JP2009266739A |
Foreign References:
| WO2011078229A1 |
Attorney, Agent or Firm:
Makoto Onda
Hironobu Onda
Hironobu Onda
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