METROLOGY SYSTEM - DWFRITZ AUTOMATION INC

Title:

METROLOGY SYSTEM

Document Type and Number:

Japanese Patent JP2022119788

Kind Code:

A

Abstract:

To provide devices, systems and methods that are associated with a measurement system for a high-speed non-contact coordinate measurement of parts.SOLUTION: A metrology system includes a metrology bridge 100 to be coupled to a measurement assembly. The measurement assembly may include a stage moveable along a plurality of independent axes. The bridge 100 may include: a housing 102; a mounting plate 118 to be coupled to the housing; and a plurality of sensor elements 104 to be mounted within the housing. The mounting plate 118 may rotatably couple the housing 102 to the measurement assembly. Further, the sensor element 104 of a plurality of sensor devices may be aligned along a length of the housing 102, and may be directed at an exterior side of the housing 102.SELECTED DRAWING: Figure 1

Inventors:

DEREK AQUI
MARK BAKER
CHRIS BARNS
ROBERT BATTEN
SHAWN BOLING
JARED GRECO
GARRETT HEADRICK
CLINT VANDERGIESSEN

Application Number:

JP2022076593A

Publication Date:

August 17, 2022

Filing Date:

May 06, 2022

Export Citation:

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