To provide a low-resistance n-type Group III nitride semiconductor layer having excellent flatness and few cracks and pits, and also to provide a Group III nitride semiconductor light emitting element having excellent light emitting efficiency with low forward voltage using the n-type Group III nitride semiconductor layer.
An n-type Group III nitride semiconductor laminated structure is formed by laminating an n-type impurity atom higher concentration layer and an n-type impurity atom lower concentration layer alternately. Further, the Group III nitride semiconductor light emitting element is constituted by providing the n-type Group III nitride semiconductor laminated structure between a substrate and a light emitting layer of Group III nitride semiconductor.
JP2000236142A | 2000-08-29 | |||
JP2002164573A | 2002-06-07 | |||
JP2004056109A | 2004-02-19 |
Takashi Ishida
Tetsuji Koga
Yoshihiro Kobayashi
Masaya Nishiyama