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Title:
Planer type heterogeneous device and its manufacturing method
Document Type and Number:
Japanese Patent JP6347081
Kind Code:
B2
Abstract:
In an embodiment a second semiconductor layer is transferred (e.g., using layer transfer techniques) on top of a first semiconductor layer. The second layer is patterned into desired wells. Between the wells, the first layer is exposed. The exposed first layer is epitaxially grown to the level of the transferred second layer to complete a planar heterogeneous substrate including both S1 and S2. The heterogeneous materials may be utilized such that, for example, a P channel device formed from one of III-V or IV materials is coplanar with an N channel device formed from one of III-V or IV materials. The embodiment requires no lattice parameter compliance due to the second layer being transferred onto the first layer. Also, there is no (or little) buffer and/or hetero-epitaxy. Other embodiments are described herein.

Inventors:
Jun, Kimin
Morrow, Patrick
Application Number:
JP2016526310A
Publication Date:
June 27, 2018
Filing Date:
December 18, 2013
Export Citation:
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Assignee:
INTEL CORPORATION
International Classes:
H01L21/20; H01L21/02; H01L21/8238; H01L27/088; H01L27/092; H01L27/12
Domestic Patent References:
JP2006527915A
JP2013201449A
JP2007142401A
JP4372166A
JP2010529666A
JP2011228651A
JP2008523620A
JP2008166776A
JP2009514252A
JP5251738A
Attorney, Agent or Firm:
Longhua International Patent Service Corporation