The probe for analog measurement for machine tool devices

Title:

The probe for analog measurement for machine tool devices

Document Type and Number:

Japanese Patent JP6010046

Kind Code:

B2

Abstract:

An analog probe for a machine tool apparatus, including a probe body and a stylus member movably secured to the probe body in a suspended rest position via a suspension mechanism. A sensor is provided for measuring the extent of displacement of the stylus member relative to the probe body from a rest position. The analog probe further includes a first compliant sealing member extending between the probe body and stylus member such that the sensor is contained within a chamber sealed from external contaminants. The analog probe also has for a suppressor for suppressing movement of the stylus member away from its suspended rest position induced by changes in the chamber's internal pressure and/or changes in the analog probe's operating environment.

Inventors:

David Roberts McMurtry
David Collingwood

Application Number:

JP2013549874A

Publication Date:

October 19, 2016

Filing Date:

January 19, 2012

Export Citation:

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