Title:
品質制御装置およびその制御方法、品質制御プログラム、並びに該プログラムを記録した記録媒体
Document Type and Number:
Japanese Patent JP3705296
Kind Code:
B1
Abstract:
Various items of data collected at different process steps are associated on production sites where traceability is hard to conduct. A quality control apparatus controls a manufacturing process in order to manufacture products of predetermined quality, including a data storing part which collects measurement data measured by multiple devices disposed in a manufacturing process and stores the collected measurement data along with measured time or collected time; and a scheduler which associates the measurement data of the devices with each other in consideration of dead time generatedbetween the devices at measured time or collected time.
Inventors:
Shiro Sugihara
Toru Fujii
Mineo Sonoe
Toru Fujii
Mineo Sonoe
Application Number:
JP2004306159A
Publication Date:
October 12, 2005
Filing Date:
October 20, 2004
Export Citation:
Assignee:
OMRON Corporation
International Classes:
G05B19/418; G06Q50/00; G06Q50/04; G07C3/00; G07C3/14; (IPC1-7): G05B19/418
Domestic Patent References:
| JP9160982A | ||||
| JP3228531A | ||||
| JP63120060A | ||||
| JP2000334641A | ||||
| JP2003241819A | ||||
| JP2000094271A | ||||
| JP2000091178A |
Attorney, Agent or Firm:
Yoshihisa Masui
Jun Himura
Jun Himura