Title:
The secondary electron multiplier for mass spectroscopes
Document Type and Number:
Japanese Patent JP6272028
Kind Code:
B2
Abstract:
A secondary electron multiplier includes: a conversion dynode for emitting a secondary electron in response to an incident ion; a plurality of dynodes configured to have multi-stages from second to final stages for receiving the secondary electron; and a first voltage applying device for applying a first negative voltage to the conversion dynode and sequentially dividing the first negative voltage to apply to each of the second-stage and subsequent dynodes, wherein the secondary electron multiplier is configured to sequentially multiply the emitted secondary electron by the second-stage and subsequent dynodes. In the secondary electron multiplier, any of the second-stage and subsequent dynodes have a second voltage applying device for applying a second negative voltage. The secondary electron multiplier has an improved ion detection efficiency without a large reduction of a usable period thereof, thereby enhancing the sensitivity of a mass spectrometer.
Inventors:
Hirano Kazushi
Application Number:
JP2013273542A
Publication Date:
January 31, 2018
Filing Date:
December 27, 2013
Export Citation:
Assignee:
AGILENT TECHNOLOGIES, INC.
International Classes:
H01J43/24
Domestic Patent References:
| JP2013524444A | ||||
| JP7142024A |
Foreign References:
| US20040232835 |
Attorney, Agent or Firm:
Satoshi Furuya
Kiyoharu Nishiyama
Kiyoharu Nishiyama
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