Title:
SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP2023046512
Kind Code:
A
Abstract:
To provide a semiconductor device capable of improving overcurrent detection accuracy of a switching element.SOLUTION: A switching element 1 comprises a main part 2 and a current sense part 3 for detecting a current value of the main part 2. A control IC 4 includes a gate drive part 5 for driving the switching element 1. A sense resistor 7 is connected between an emitter of the main part 2 and an emitter of the current sense part 3 and formed inside of the control IC 4. A comparator 8 compares a sense voltage Vs applied to the sense resistor 7 with a reference voltage Vref. When the sense voltage Vs exceeds the reference voltage Vref, a cutoff circuit 9 cuts off electrification of the switching element 1. When the electrification of the switching element 1 is cut off, the sense voltage Vs is 1 V or higher.SELECTED DRAWING: Figure 1
Inventors:
EGUCHI KEISUKE
MIYAZAKI TAKAMASA
MIYAZAKI TAKAMASA
Application Number:
JP2021155138A
Publication Date:
April 05, 2023
Filing Date:
September 24, 2021
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
H03K17/08; G01R31/26; H02M1/00
Attorney, Agent or Firm:
Patent Attorney Takada / Takahashi International Patent Office