Title:
ABNORMALITY CLASSIFICATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/138775
Kind Code:
A1
Abstract:
This abnormality classification device determines whether a detected abnormality is a known abnormality or an unknown abnormality, and presents a user with a response not only in the case of a known abnormality, but also in the case of an unknown abnormality. This abnormality classification device acquires data related to a physical quantity detected when an abnormality has occurred in an industrial machine as abnormality data, creates a model for determining whether abnormality data is due to a known cause of abnormality and a model for classifying to which cause of abnormality abnormality data belongs, and then uses the created models to determine whether the abnormality data is due to a known cause of abnormality and to classify the abnormality data as being due to one cause of abnormality.
Inventors:
SATOU KAZUHIRO (JP)
IIJIMA KAZUNORI (JP)
SATO MOTOKI (JP)
IIJIMA KAZUNORI (JP)
SATO MOTOKI (JP)
Application Number:
PCT/JP2021/047724
Publication Date:
June 30, 2022
Filing Date:
December 22, 2021
Export Citation:
Assignee:
FANUC CORP (JP)
International Classes:
G05B23/02
Foreign References:
| JP2019185422A | 2019-10-24 | |||
| US20150346066A1 | 2015-12-03 |
Attorney, Agent or Firm:
AIWA INTERNATIONAL PATENT AGENCY (JP)
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