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Title:
ABNORMALITY DETECTION DEVICE FOR DETECTION CIRCUITS AND ELECTRIC CIRCUITS, AND DETECTION SYSTEM AND ELECTRONIC SYSTEM USING THE ABNORMALITY DETECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2010/119532
Kind Code:
A1
Abstract:
Disclosed is an abnormality detection device and system for an electrical circuit, the performance of which changes according to the surrounding environment, said device being capable of reliably detecting an abnormality in the electrical circuit even when values of the surrounding environment cannot be identified. The abnormality detection device detects an abnormality in a detection circuit (112) which detects physical quantities in specific categories, and comprises an abnormality detector (220a) which changes the power supply voltage (Vcc') for the detection circuit, and based on an output signal (Vo2) from the detection circuit (112) at a post-change power supply voltage (Vc2), detects an abnormality in the detection circuit (112).

Inventors:
SY WILLIAMSON (JP)
TAJIRI DAICHI (JP)
YURUE KENJI (JP)
KURITA YASUAKI (JP)
STEGMAIER JUERGEN (DE)
ABU WHISHAH MUSTAFA (DE)
AKITA KAKEO (JP)
TAKASAKI MINORU (JP)
Application Number:
PCT/JP2009/057606
Publication Date:
October 21, 2010
Filing Date:
April 15, 2009
Export Citation:
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Assignee:
BOSCH CORP (JP)
SY WILLIAMSON (JP)
TAJIRI DAICHI (JP)
YURUE KENJI (JP)
KURITA YASUAKI (JP)
STEGMAIER JUERGEN (DE)
ABU WHISHAH MUSTAFA (DE)
AKITA KAKEO (JP)
TAKASAKI MINORU (JP)
International Classes:
G01R31/00; G01R31/02
Foreign References:
JPH06229778A1994-08-19
US20080103705A12008-05-01
JPH0545543U1993-06-18
JP2005164435A2005-06-23
Attorney, Agent or Firm:
ONO, Shinjiro et al. (JP)
Ono Shinjiro (JP)
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