Title:
ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD, PROGRAM, AND INFORMATION PROCESSING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2021/006287
Kind Code:
A1
Abstract:
An imaging unit 500 acquires a captured image by using a lens whose effective image circle is smaller than the imaging surface of an image sensor. A vignetting amount calculation unit 2212 of a detection unit 221 individually calculates, for example, the area size of the vignetting area generated in the captured image acquired by the imaging unit 500 at the four corners. A determination unit 2214 detects a change in the area size calculated during a focus abnormality detection process with respect to the area size calculated at the reference time, and determines that focus abnormality is detected when the change in the area size at any of the four corners exceeds a threshold value. It becomes possible to detect focus abnormalities with high accuracy.
Inventors:
YAMASHITA YUTARO (JP)
Application Number:
PCT/JP2020/026645
Publication Date:
January 14, 2021
Filing Date:
July 08, 2020
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H04N5/232; G03B15/00; G03B17/02; G08G1/16; H04N5/225
Domestic Patent References:
| WO2018123639A1 | 2018-07-05 |
Foreign References:
| JP2013038620A | 2013-02-21 | |||
| JP2014006243A | 2014-01-16 |
Other References:
See also references of EP 3998769A4
Attorney, Agent or Firm:
MIYATA, Masaaki et al. (JP)
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